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dc.contributor.authorOrsi, Thomas H.
dc.contributor.authorDuncan, Michael E.
dc.contributor.authorLyons, Anthony P.
dc.contributor.authorBriggs, Kevin B.
dc.contributor.authorRichardson, Michael D.
dc.contributor.authorAnderson, Aubrey L.
dc.date.accessioned2018-10-11T14:08:19Z
dc.date.available2018-10-11T14:08:19Z
dc.date.issued1997
dc.identifier11494
dc.identifier.govdocCP-45
dc.identifier.urihttp://hdl.handle.net/20.500.12489/452
dc.description.abstractQuantitative information on fine-scale sediment inhomogeneity is extremely scarce and sorely needed for developing realistic volume scattering models. To address this deficiency, we present a novel approach for sediment core characterization, X-ray computed tomography (CT). By providing a means to construct extremely fine-scale density profiles and to quantify volume inhomogeneities in two- and three-dimensions, CT analyses can assist efforts in characterizing benthic processes and result in more accurate inputs for modeling acoustic backscatter.
dc.format7 p. : ill. ; digital, PDF file
dc.languageEnglish
dc.publisherNATO. SACLANTCEN
dc.sourceIn: High Frequency Seafloor Acoustics (SACLANTCEN Conference Proceedings CP-45), 1997, pp. 409-416
dc.subjectSeafloor characterization
dc.subjectSeafloor sediments
dc.subjectAcoustic scattering - Seafloor and sea surface
dc.subjectModelling and simulation
dc.subjectAcoustic tomography
dc.titleHigh-resolution characterization of seafloor sediments for modeling acoustic backscatter
dc.typePapers and Articles
dc.typeConference Proceedings (CP)


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